Most trusted source for Tendering Opportunities and Business Intelligence since 2002
Most trusted source for Tendering Opportunities and Business Intelligence since 2002
Country - Switzerland
Summary - Fib / Tem Ga Focused Ion Beam Instrument And Transmission Electron Microscope
Deadline - Aug 10, 2025
GT reference number - 111468046
Product classification - Electron microscopes
Address - Switzerland
Contact details - 565656565
Tender notice no. - 76454545
GT Ref Id - 111468046
Document Type - Tender Notices
Description - Description: The two instruments shall warrant a smooth workflow for TEM sample preparation by FIB and state-of-the-art sample characterization by analytical, high-resolution TEM/STEM, particularly, but not exclusively. A broad spectrum of materials science samples shall be addressed, including highly fragile and beam-sensitive samples such as, e.g., Li-based thin-film battery materials, carbon-based nanomaterials or zeolites for catalytic applications. Energy dispersive X-ray (EDX) analytics is required on both instruments, special acquisition modes in STEM are desirable, namely 4D-STEM in combination with the TEM camera, and a segmented detector for differential phase contrast STEM. Beside
Gt Ref Id - 111468046
Deadline - Aug 10, 2025
Similar Tenders :
Join to access thousands of business opportunities
Why Us
3,00,000 +
Users
190 +
Countries Covered
5,00,000 +
Agencies Tracked
50,000 +
Notices Daily
90 Million +
Database
