Delivery Of An Atomic Force Microscope Enabling Automatic Measurements

  Address - Poland

  Contact details - 565656565

  Tender notice no. - 76454545

  GT Ref Id - 120612686

  Document Type - Tender Notices

Description - Description: The subject of the order is an atomic force microscope (AFM) set enabling the measurement of topography and other properties of substrates and epitaxial layers of semiconductor structures, in particular those produced by the MBE method o n GaN substrates, consisting of:1) Independent scanners in the Z and XY axis, where the Z axis scanner is integrated in the microscope head and the XY scanner is an element of the scanning table.2) An automated table enabling measurements of substrates with a diameter of 2" as well as measurements of smaller samples.3) Optical set for viewing the sample4) Electronic, digital microscope controller5) Sound-absorbing chamber and active anti-vibratio

Gt Ref Id - 120612686

Deadline - Nov 21, 2025