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Cryogenic Electron Microscopy System With 300 Kv Transmission Cryo-Electron Microscope And Cryogenic Focused Ion Beam Scanning Electron Microscope

University of Helsinki Finland has Released a tender for Cryogenic Electron Microscopy System With 300 Kv Transmission Cryo-Electron Microscope And Cryogenic Focused Ion Beam Scanning Electron Microscope in laboratory equipment and services . The tender was released on Oct 14, 2025.

Country - Finland

Summary - Cryogenic Electron Microscopy System With 300 Kv Transmission Cryo-Electron Microscope And Cryogenic Focused Ion Beam Scanning Electron Microscope

Deadline - Nov 12, 2025

GT reference number - 120141936

Product classification - Microscopes

Organization Details:

  Address - Finland

  Contact details - 565656565

  Tender notice no. - 76454545

  GT Ref Id - 120141936

  Document Type - Tender Notices

Notice Details and Documents:

Description - Description: The Institute of Biotechnology Structural Biology Platform (INSTRUCT-HiLFE) will be upgrading its cryogenic electron microscopy (cryo-EM) services. The current 200 kV transmission electron microscope will be replaced with equipment offer ing higher resolution for both single-particle and tomography analysis. To enable this, we will establish an integrated workflow for producing samples for tomography and single-particle analysis. Specifically, we will acquire a 300 kV cryogenic transmission electron microscope (cryo-TEM) suitable for high-resolution structural biology, together with a software and hardware compatible cryogenic focused ion beam scanning electron microscope (cryo-F

Gt Ref Id - 120141936

Deadline - Nov 12, 2025

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