Ultra-Low Voltage Focused Ion Beam Scanning Electron Microscope Dual-Beam System Procurement Project Of Ningbo Institute Of Materials Technology And Engineering, Chinese Academy Of Sciences - International Tender Announcement (2)

Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences China has Released a tender for Ultra-Low Voltage Focused Ion Beam Scanning Electron Microscope Dual-Beam System Procurement Project Of Ningbo Institute Of Materials Technology And Engineering, Chinese Academy Of Sciences - International Tender Announcement (2) in laboratory equipment and services . The tender was released on Apr 16, 2024.

Country - China

Summary - Ultra-Low Voltage Focused Ion Beam Scanning Electron Microscope Dual-Beam System Procurement Project Of Ningbo Institute Of Materials Technology And Engineering, Chinese Academy Of Sciences - International Tender Announcement (2)

Deadline - May 08, 2024

GT reference number - 80909809

Product classification - Laboratory, optical and precision equipments (excl. glasses)