Toggle Offcanvas
...
Global Government Tenders

Most trusted source for Tendering Opportunities and Business Intelligence since 2002

Supply Of A Beam Microscope Of Focused Ions (Fib) With Plasma Coupled With A Scanning Electron Microscope Column (Meb)

COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES France has Released a tender for Supply Of A Beam Microscope Of Focused Ions (Fib) With Plasma Coupled With A Scanning Electron Microscope Column (Meb) in Technology Hardware and Equipment. The tender was released on Aug 11, 2025.

Country - France

Summary - Supply Of A Beam Microscope Of Focused Ions (Fib) With Plasma Coupled With A Scanning Electron Microscope Column (Meb)

Deadline - Aug 26, 2025

GT reference number - 115412684

Product classification - Microelectronic machinery and apparatus

Organization Details:

  Address - France

  Contact details - 565656565

  Tender notice no. - 76454545

  GT Ref Id - 115412684

  Document Type - Tender Notices

Notice Details and Documents:

Description - Description: The consultation includes: - The supply of a beam microscope of focused ions (FIB) with plasma coupled with a scanning electron microscope column (MEB),- Options with compulsory encryption:o Option n ° 1: Maintenance training 1st levelo option n ° 2: additional pioneerso Option n ° 3: additional sampling holdero option n ° 4: consumables (including standard opening configurations)o option n ° 5: transfer system or sensitive materialso option n ° 6: cooling of nitrogen sampleso Option n ° 7: cooling of nitrogen samples- Optional costing options:o option n ° 8: Xenon bottle for the source (with planned lifespan/warranty)o Option n ° 9: Possibility to filter secondary elec

Gt Ref Id - 115412684

Deadline - Aug 26, 2025

Share share

Similar Tenders :

Create Account

Why Us

3,00,000 +

Users

190 +

Countries Covered

5,00,000 +

Agencies Tracked

50,000 +

Notices Daily

90 Million +

Database