Most trusted source for Tendering Opportunities and Business Intelligence since 2002
Country - France
Summary - Supply Of A Beam Microscope Of Focused Ions (Fib) With Plasma Coupled With A Scanning Electron Microscope Column (Meb)
Deadline - Aug 26, 2025
GT reference number - 115412684
Product classification - Microelectronic machinery and apparatus
Address - France
Contact details - 565656565
Tender notice no. - 76454545
GT Ref Id - 115412684
Document Type - Tender Notices
Description - Description: The consultation includes: - The supply of a beam microscope of focused ions (FIB) with plasma coupled with a scanning electron microscope column (MEB),- Options with compulsory encryption:o Option n ° 1: Maintenance training 1st levelo option n ° 2: additional pioneerso Option n ° 3: additional sampling holdero option n ° 4: consumables (including standard opening configurations)o option n ° 5: transfer system or sensitive materialso option n ° 6: cooling of nitrogen sampleso Option n ° 7: cooling of nitrogen samples- Optional costing options:o option n ° 8: Xenon bottle for the source (with planned lifespan/warranty)o Option n ° 9: Possibility to filter secondary elec
Gt Ref Id - 115412684
Deadline - Aug 26, 2025
Similar Tenders :
Summary:
|
Why Us
3,00,000 +
Users
190 +
Countries Covered
5,00,000 +
Agencies Tracked
50,000 +
Notices Daily
90 Million +
Database