Most trusted source for Tendering Opportunities and Business Intelligence since 2002
Most trusted source for Tendering Opportunities and Business Intelligence since 2002
Country - Germany
Summary - Semiconductor Test System (Mixed-Signal Test System) Soc Test System (Pr1025624 - 2270-W)
Deadline - Oct 01, 2025
GT reference number - 116917085
Product classification - Electrical machinery, apparatus, equipment and consumables; lighting
Address - Germany
Contact details - 565656565
Tender notice no. - 76454545
GT Ref Id - 116917085
Document Type - Tender Notices
Description - Description: Beschreibung: This specification describes the requirements for a semiconductor test system (mixed-signal test system) to be used for post-silicon verification, characterization and functional test of integrated circuits and chiplets at Fraunhofer EMFT.The test system must provide interfaces that allow connection with additional lab equipment, i.e. precision SMUs, oscilloscopes and a manual or semi-automatic wafer prober. The test system has to be compatible in Hard- and Softwareto an already existing Advantest V93000 test system in the Fraunhofer-Gesellschaft.local title:: Semiconductor test system (mixed-signal test system) SOC Test System (PR1025624 - 2270-W)Contract Duration
Gt Ref Id - 116917085
Deadline - Oct 01, 2025
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