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Country - Finland
Summary - Scanning Electron Microscope
Deadline - Aug 21, 2025
GT reference number - 115038874
Product classification - Microscopes
Address - Finland
Contact details - 565656565
Tender notice no. - 76454545
GT Ref Id - 115038874
Document Type - Tender Notices
Description - Description: Instrument to be purchased is a Scanning Electron Microscope (SEM) for 200 mm standard wafer compatibility. An automated measurement over entire wafer is required. Also, EDS detector and 3D metrology are required. The instrument shall in clude standard back scattered electrons and secondary electrons detectors as well as cathodoluminescence detector. The SEM to be purchased will replace our current LEO 1550 used since 1997.local title:: Scanning Electron Microscopelocal description: : Instrument to be purchased is a Scanning Electron Microscope (SEM) for 200 mm standard wafer compatibility. An automated measurement over entire wafer is required. Also, EDS detector and 3D metrolog
Gt Ref Id - 115038874
Deadline - Aug 21, 2025
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