Procurement Of 0729-244Oit270103 Ultra-Low Voltage Focused Ion Beam Scanning Electron Microscope Dual-Beam System(1)

Name: Procurement Of 0729-244Oit270103 Ultra-Low Voltage Focused Ion Beam Scanning Electron Microscope Dual-Beam System(1)
Start: 2024-04-08
End: 2024-04-29
Location: The Ningbo Institute of Industrial Technology(CNITECH) of the Chinese Academy of Sciences(CAS)

The Ningbo Institute of Industrial Technology(CNITECH) of the Chinese Academy of Sciences(CAS) China has Released a tender for Procurement Of 0729-244Oit270103 Ultra-Low Voltage Focused Ion Beam Scanning Electron Microscope Dual-Beam System(1) in laboratory equipment and services . The tender was released on Apr 08, 2024.

Country - China

Summary - Procurement Of 0729-244Oit270103 Ultra-Low Voltage Focused Ion Beam Scanning Electron Microscope Dual-Beam System(1)

Deadline - login to view

GT reference number - 80592191

Product classification - Laboratory, optical and precision equipments (excl. glasses)

Organization Details:

Address - China

Contact details - 565656565

Tender notice no. - 76454545

GT Ref Id - 80592191

Document Type - Tender Notices

Notice Details and Documents:

Description - Description: Procurement Of 0729-244Oit270103 Ultra-Low Voltage Focused Ion Beam Scanning Electron Microscope Dual-Beam System(1)local title:: Procurement of 0729-244OIT270103 Ultra-low voltage focused ion beam scanning electron microscope dual-beam system(1)type_of_procedure: Otherbidding_response_method: Not Available

Gt Ref Id - 80592191

Deadline - Apr 29, 2024

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