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Plasma Focused Ion Beam - Scanning Electron Microscope Dualbeam System

Korea Electronics Research Institute South Korea has Released a tender for Plasma Focused Ion Beam - Scanning Electron Microscope Dualbeam System in laboratory equipment and services . The tender was released on Apr 23, 2024.

Country - South Korea

Summary - Plasma Focused Ion Beam - Scanning Electron Microscope Dualbeam System

Deadline - May 07, 2024

GT reference number - 81162852

Product classification - Electron microscopes

Organization Details:

  Address - South Korea

  Contact details - 565656565

  Tender notice no. - 76454545

  GT Ref Id - 81162852

  Document Type - Tender Notices

Notice Details and Documents:

Description - Korea Electronics Research Institute has released a Tender Notice for Plasma Focused Ion Beam - Scanning Electron Microscope Dualbeam System. Global Tenders is not only confined to tenders but we also upload crucial information, from future prospects to past market records.

Gt Ref Id - 81162852

Deadline - May 07, 2024

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