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Measuring Devices For The Characterization Of Rf Semiconductor Devices

EPFL-Scientific Equipment Switzerland has Released a tender for Measuring Devices For The Characterization Of Rf Semiconductor Devices in laboratory equipment and services . The tender was released on Aug 11, 2025.

Country - Switzerland

Summary - Measuring Devices For The Characterization Of Rf Semiconductor Devices

Deadline - Sep 17, 2025

GT reference number - 115400050

Product classification - Laboratory, optical and precision equipments (excl. glasses)

Organization Details:

  Address - Switzerland

  Contact details - 565656565

  Tender notice no. - 76454545

  GT Ref Id - 115400050

  Document Type - Tender Notices

Notice Details and Documents:

Description - Description: The EPFL wishes to acquire an active LOAD-Pull measurement system below Térahertz (Sub-Thz), as well as a series of frequency extensors adapted to VNA and VMU measuring units, for the characterization of RF semiconductor devices (3 lots ). This system will cover a frequency range ranging from around 75 GHz to 260 GHz for high power measurements, as well as additional low-power extensors covering the 220 GHz range at 330 GHz (and beyond), for the powerlab of the Institute of Electrical Engineering and Microtechnic (IEM).The equipment will be dedicated to the peak search on the power systems in millimeter and sub-Thz waves, as well as on the hyperfrequency monolithic circuits (MMI

Gt Ref Id - 115400050

Deadline - Sep 17, 2025

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