In Situ Micromechanical Testing System Designed For Use Within A Scanning Electron Microscope (Sem) Environment

  Address - Sweden

  Contact details - 565656565

  Tender notice no. - 76454545

  GT Ref Id - 116179840

  Document Type - Tender Notices

Description - Description: The procuring entity seeks to acquire a state-of-the-art in-situ micromechanical testing module for integration into an existing JEOL JSM-IT300 Scanning Electron Microscope (SEM). The system will expand the group’s capabilities in adva nced materials research, enabling high-precision micromechanical testing and simultaneous microstructural analysis.local title:: in situ micromechanical testing system designed for use within a Scanning Electron Microscope (SEM) environmentContract Type: : Supplylocal description: : The procuring entity seeks to acquire a state-of-the-art in-situ micromechanical testing module for integration into an existing JEOL JSM-IT300 Scanning Electron Micr

Gt Ref Id - 116179840

Deadline - Sep 05, 2025