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Country - Italy
Summary - Focused Ionic Bundle Microscope (Fib) Combined With An Electronic Scan Electronic Microscope (Sem) For The Preparation Of Samples For Electronic Microscopy
Deadline - May 26, 2025
GT reference number - 107599819
Product classification - Laboratory, optical and precision equipments (excl. glasses)
Address - Italy
Contact details - 565656565
Tender notice no. - 76454545
GT Ref Id - 107599819
Document Type - Tender Notices
Description - Description: Focused ionic bundle microscope (FIB) combined with an electronic microscope with scanning (SEM) for: - observation with nanometric resolution of micro and nanostructures through secondary electrons, retrodic and transmitted; - Complete realization and also assisted the thin preparations for analysis with the Temp microscopy; - Single or multiple sectioning via controlled sequence of structures of interest, obtained through deposition of protective layers and erosion via FIB.local title:: MICROSCOPIO A FASCIO IONICO FOCALIZZATO (FIB) COMBINATO CON UN MICROSCOPIO ELETTRONICO A SCANSIONE (SEM) PER LA PREPARAZIONE DI CAMPIONI PER MICROSCOPIA ELETTRONICAlocal description: : MICROSCO
Gt Ref Id - 107599819
Deadline - May 26, 2025
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