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Country - Netherlands
Summary - Focused Ion Beam Scanning Electron Microscope
Deadline - login to view
GT reference number - 81303537
Product classification - Electron microscopes
Address - Netherlands
Contact details - 565656565
Tender notice no. - 76454545
GT Ref Id - 81303537
Document Type - Tender Notices
Description - Description: In the context of the Quantum Delta NL growth fund subsidy, the AMOLF Nano Lab Amsterdam invests in new infrastructure for nano manufacturing and nano characterization. Part of this investment within the second phase of the investment pr ogram is the purchase of a Focused ion beam scanning electron microscope for the AMOLF Nano Lab. €1,705,180.local title:: Gefocusseerde ionenbundel scanning-elektronenmicroscoop.type_of_procedure: Negotiated without prior call for competition.bidding_response_method: Not Available
Gt Ref Id - 81303537
Deadline - Nov 30, -0001
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