Electron Microscopy (Sem) System Coupled To A Focused Ion Beam (Fib)

Name: Electron Microscopy (Sem) System Coupled To A Focused Ion Beam (Fib)
Start: 2024-04-23
End: 2024-05-21
Location: ENS Paris-Saclay

ENS Paris-Saclay France has Released a tender for Electron Microscopy (Sem) System Coupled To A Focused Ion Beam (Fib) in laboratory equipment and services . The tender was released on Apr 23, 2024.

Country - France

Summary - Electron Microscopy (Sem) System Coupled To A Focused Ion Beam (Fib)

Deadline - May 21, 2024

GT reference number - 81153586

Product classification - Ion microscopes

Organization Details:

Address - France

Contact details - 565656565

Tender notice no. - 76454545

GT Ref Id - 81153586

Document Type - Tender Notices

Notice Details and Documents:

Description - Description: Electron Microscopy (Sem) System Coupled To A Focused Ion Beam (Fib)local title:: Système de microscopie électronique (MEB) couplé à un faisceau dions focalisé (FIB)type_of_procedure: Otherbidding_response_method: Not Available Global Tenders is not only confined to tenders but we also upload crucial information, from future prospects to past market records.

Gt Ref Id - 81153586

Deadline - May 21, 2024

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