Chips Xafs And Diffraction, Silicon Drift Detector

  Address - United States

  Contact details - 565656565

  Tender notice no. - 76454545

  GT Ref Id - 81556763

  Document Type - Tender Notices

Description - BACKGROUND This project involves an existing NIST Synchrotron beamline at the National Synchrotron Light Source II (NSLS-II) and an existing CRADA with IBM. It’s purpose is to improve the X-ray Absorption Spectroscopy (XAS) measurement capabilities for state of the art semiconductor samples working directly with IBM researchers stationed at NIST’s Beamline for Materials Measurement (BMM) and other researchers studying materials for information technology.  The proposed detector enhancement will substantially increase sample throughput and measurement sensitivity, driving the ability to probe semiconductor device interfaces, a broader set of element/matrix combinations, and nanoscale str

Gt Ref Id - 81556763

Deadline - May 03, 2024