Chips Microwave Impedance Microscopy Module For Quantitative Assessment Of Defects

  Address - United States

  Contact details - 565656565

  Tender notice no. - 76454545

  GT Ref Id - 81137519

  Document Type - Tender Notices

Description - BACKGROUND As part of the CHIPS Act, researchers at the National Institute of Standards and Technology (NIST) are engaged in metrology research and development to promote innovation and industrial competitiveness in U.S. semiconductor device manufact uring. NIST has identified seven Grand Challenges in metrology research and development that require critical attention. As part of efforts to advance metrology tools and measurement science for Modeling and Simulating Semiconductors, Designs, and Components (Grand Challenge 4), NIST requires instruments for measurement of defects in compound semiconductors, as well as related heterostructures and microelectronic devices. Specifically, NIST requi

Gt Ref Id - 81137519

Deadline - May 03, 2024