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Country - Czech Republic
Summary - Analytical Focused Ion Beam Scanning Electron Microscope
Deadline - May 22, 2024
GT reference number - 81430909
Product classification - Microscopes
Address - Czech Republic
Contact details - 565656565
Tender notice no. - 76454545
GT Ref Id - 81430909
Document Type - Tender Notices
Description - Description: The subject of the order is the supply, installation and training to work (including application training) on a FIB-SEM microscope with an ion beam equipped with analytical methods of EDS and in-situ indentation.local title:: Analy tický skenovací elektronový mikroskop s fokusovaným iontovým svazkemtype_of_procedure: Otherbidding_response_method: Not Available
Gt Ref Id - 81430909
Deadline - May 22, 2024
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