300Mm Xrd (Ipms-Cnt07.2) (Pr904697-2480-P)

  Address - Germany

  Contact details - 565656565

  Tender notice no. - 76454545

  GT Ref Id - 108846538

  Document Type - Tender Notices

Description - Description: Description: 1 piece 300mm XRDX-ray sailing ractometers that are suitable for analyzing 300 mm full wafer-neck conductor samples and wafer fragments. The equipment must be very flexible in order to be able to carry out a large number of different tests with different test sets.The X-ray sailing ractometer is suitable for laboratory use in the semiconductor area for flexion measurements in the striping idea (GI XRD), reflectometry measurements (XRR), polar figure and texture measurements, high-resolution diffraction measurements (HRXRD) and voltage analyzes for 300mm and 200mm wafers and for silicia-wafer fragments and is with equipped all necessary subsystems (e.g. cooler).Optio

Gt Ref Id - 108846538

Deadline - Jun 13, 2025