Supply And Installation Of An Electronic Scanning Microscope With Fib (Focused Ion Beam), X -Ray Analysis System And Mass Ablation System Of Material By Clustered Laser, Destined For The Institute Of Microelectronics Of Seville Of The State Agency Higher Council For Scientific Research.

Name: Supply And Installation Of An Electronic Scanning Microscope With Fib (Focused Ion Beam), X -Ray Analysis System And Mass Ablation System Of Material By Clustered Laser, Destined For The Institute Of Microelectronics Of Seville Of The State Agency Higher Council For Scientific Research.
Start: 2025-06-12
End: 2025-07-14
Location: Secretaria General de la Agencia Estatal Consejo Superior de Investigaciones Cientificas

Secretaria General de la Agencia Estatal Consejo Superior de Investigaciones Cientificas Spain has Released a tender for Supply And Installation Of An Electronic Scanning Microscope With Fib (Focused Ion Beam), X -Ray Analysis System And Mass Ablation System Of Material By Clustered Laser, Destined For The Institute Of Microelectronics Of Seville Of The State Agency Higher Council For Scientific Research. in laboratory equipment and services . The tender was released on Jun 11, 2025.

Country - Spain

Summary - Supply And Installation Of An Electronic Scanning Microscope With Fib (Focused Ion Beam), X -Ray Analysis System And Mass Ablation System Of Material By Clustered Laser, Destined For The Institute Of Microelectronics Of Seville Of The State Agency Higher Council For Scientific Research.

Deadline - login to view

GT reference number - 110765773

Product classification - Scanning electron microscopes

Organization Details:

Address - Spain

Contact details - 565656565

Tender notice no. - 76454545

GT Ref Id - 110765773

Document Type - Tender Notices

Notice Details and Documents:

Description - Description: Supply and installation of an electronic scanning microscope with FIB (Focused Ion Beam), X -ray analysis system and mass ablation system of material by clustered laser, destined for the Institute of Microelectronics of Seville of the St ate Agency Higher Council for Scientific Research.local title:: Suministro e instalación de un microscopio electrónico de barrido con FIB (Focused Ion Beam), sistema de análisis por rayos X y sistema de ablación masiva de material mediante láser pulsado, destinado al Instituto de Microelectrónica de Sevilla de la Agencia Estatal Consejo Superior de Investigaciones Científicas.Contract Type: : Supplylocal description: : Suministro e instala

Gt Ref Id - 110765773

Deadline - Jul 14, 2025